Cargando…
SRF cavity testing using a FPGA Self Excited Loop
This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fas...
Autor principal: | |
---|---|
Lenguaje: | eng |
Publicado: |
2018
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2320432 |
_version_ | 1780958479239872512 |
---|---|
author | Ben-Zvi, Ilan |
author_facet | Ben-Zvi, Ilan |
author_sort | Ben-Zvi, Ilan |
collection | CERN |
description | This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements. |
id | cern-2320432 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2018 |
record_format | invenio |
spelling | cern-23204322019-09-30T06:29:59Zhttp://cds.cern.ch/record/2320432engBen-Zvi, IlanSRF cavity testing using a FPGA Self Excited LoopAccelerators and Storage RingsThis document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.CERN-ACC-NOTE-2018-0039oai:cds.cern.ch:23204322018-05-28 |
spellingShingle | Accelerators and Storage Rings Ben-Zvi, Ilan SRF cavity testing using a FPGA Self Excited Loop |
title | SRF cavity testing using a FPGA Self Excited Loop |
title_full | SRF cavity testing using a FPGA Self Excited Loop |
title_fullStr | SRF cavity testing using a FPGA Self Excited Loop |
title_full_unstemmed | SRF cavity testing using a FPGA Self Excited Loop |
title_short | SRF cavity testing using a FPGA Self Excited Loop |
title_sort | srf cavity testing using a fpga self excited loop |
topic | Accelerators and Storage Rings |
url | http://cds.cern.ch/record/2320432 |
work_keys_str_mv | AT benzviilan srfcavitytestingusingafpgaselfexcitedloop |