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SRF cavity testing using a FPGA Self Excited Loop

This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fas...

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Autor principal: Ben-Zvi, Ilan
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2320432
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author Ben-Zvi, Ilan
author_facet Ben-Zvi, Ilan
author_sort Ben-Zvi, Ilan
collection CERN
description This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.
id cern-2320432
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
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spelling cern-23204322019-09-30T06:29:59Zhttp://cds.cern.ch/record/2320432engBen-Zvi, IlanSRF cavity testing using a FPGA Self Excited LoopAccelerators and Storage RingsThis document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.CERN-ACC-NOTE-2018-0039oai:cds.cern.ch:23204322018-05-28
spellingShingle Accelerators and Storage Rings
Ben-Zvi, Ilan
SRF cavity testing using a FPGA Self Excited Loop
title SRF cavity testing using a FPGA Self Excited Loop
title_full SRF cavity testing using a FPGA Self Excited Loop
title_fullStr SRF cavity testing using a FPGA Self Excited Loop
title_full_unstemmed SRF cavity testing using a FPGA Self Excited Loop
title_short SRF cavity testing using a FPGA Self Excited Loop
title_sort srf cavity testing using a fpga self excited loop
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/2320432
work_keys_str_mv AT benzviilan srfcavitytestingusingafpgaselfexcitedloop