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Analysis and design of integrated circuits

Detalles Bibliográficos
Autores principales: Hamilton, Douglas J, Lynn, David K, Meyer, Charles S
Lenguaje:eng
Publicado: McGraw-Hill 1967
Materias:
Acceso en línea:http://cds.cern.ch/record/233740
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author Hamilton, Douglas J
Lynn, David K
Meyer, Charles S
author_facet Hamilton, Douglas J
Lynn, David K
Meyer, Charles S
author_sort Hamilton, Douglas J
collection CERN
id cern-233740
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1967
publisher McGraw-Hill
record_format invenio
spelling cern-2337402021-04-22T04:07:17Zhttp://cds.cern.ch/record/233740engHamilton, Douglas JLynn, David KMeyer, Charles SAnalysis and design of integrated circuitsEngineeringMcGraw-Hilloai:cds.cern.ch:2337401967
spellingShingle Engineering
Hamilton, Douglas J
Lynn, David K
Meyer, Charles S
Analysis and design of integrated circuits
title Analysis and design of integrated circuits
title_full Analysis and design of integrated circuits
title_fullStr Analysis and design of integrated circuits
title_full_unstemmed Analysis and design of integrated circuits
title_short Analysis and design of integrated circuits
title_sort analysis and design of integrated circuits
topic Engineering
url http://cds.cern.ch/record/233740
work_keys_str_mv AT hamiltondouglasj analysisanddesignofintegratedcircuits
AT lynndavidk analysisanddesignofintegratedcircuits
AT meyercharless analysisanddesignofintegratedcircuits