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Measurement of transistor parameters
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Iliffe
1969
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/234511 |
| _version_ | 1780884526448246784 |
|---|---|
| author | Paul, Reinhold |
| author_facet | Paul, Reinhold |
| author_sort | Paul, Reinhold |
| collection | CERN |
| id | cern-234511 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1969 |
| publisher | Iliffe |
| record_format | invenio |
| spelling | cern-2345112021-04-22T04:05:11Zhttp://cds.cern.ch/record/234511engPaul, ReinholdMeasurement of transistor parametersEngineeringIliffeoai:cds.cern.ch:2345111969 |
| spellingShingle | Engineering Paul, Reinhold Measurement of transistor parameters |
| title | Measurement of transistor parameters |
| title_full | Measurement of transistor parameters |
| title_fullStr | Measurement of transistor parameters |
| title_full_unstemmed | Measurement of transistor parameters |
| title_short | Measurement of transistor parameters |
| title_sort | measurement of transistor parameters |
| topic | Engineering |
| url | http://cds.cern.ch/record/234511 |
| work_keys_str_mv | AT paulreinhold measurementoftransistorparameters |