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Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
1992
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/248554 |
| _version_ | 1780885403446804480 |
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| author | Heijne, Erik H M |
| author_facet | Heijne, Erik H M |
| author_sort | Heijne, Erik H M |
| collection | CERN |
| id | cern-248554 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1992 |
| record_format | invenio |
| spelling | cern-2485542019-09-30T06:29:59Zhttp://cds.cern.ch/record/248554engHeijne, Erik H MImaging with 2D and 3D integrated semiconductor detectors using VLSI technologyDetectors and Experimental TechniquesCERN-ECP-92-025CERN-ECP-92-25oai:cds.cern.ch:2485541992-12-21 |
| spellingShingle | Detectors and Experimental Techniques Heijne, Erik H M Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology |
| title | Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology |
| title_full | Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology |
| title_fullStr | Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology |
| title_full_unstemmed | Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology |
| title_short | Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology |
| title_sort | imaging with 2d and 3d integrated semiconductor detectors using vlsi technology |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/248554 |
| work_keys_str_mv | AT heijneerikhm imagingwith2dand3dintegratedsemiconductordetectorsusingvlsitechnology |