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Imaging with 2D and 3D integrated semiconductor detectors using VLSI technology

Detalles Bibliográficos
Autor principal:	Heijne, Erik H M
Lenguaje:	eng
Publicado:	1992
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/248554

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