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Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
McGraw-Hill
1967
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/250050 |
| _version_ | 1780885474509848576 |
|---|---|
| author | Schwartz, Seymour |
| author_facet | Schwartz, Seymour |
| author_sort | Schwartz, Seymour |
| collection | CERN |
| id | cern-250050 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1967 |
| publisher | McGraw-Hill |
| record_format | invenio |
| spelling | cern-2500502021-04-22T03:55:19Zhttp://cds.cern.ch/record/250050engSchwartz, SeymourIntegrated circuit technology: instrumentation and techniques for measurement, process, and failure analysisEngineeringMcGraw-Hilloai:cds.cern.ch:2500501967 |
| spellingShingle | Engineering Schwartz, Seymour Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| title | Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| title_full | Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| title_fullStr | Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| title_full_unstemmed | Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| title_short | Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| title_sort | integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis |
| topic | Engineering |
| url | http://cds.cern.ch/record/250050 |
| work_keys_str_mv | AT schwartzseymour integratedcircuittechnologyinstrumentationandtechniquesformeasurementprocessandfailureanalysis |