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Methods to compare and to obtain representative emittance values from fundamentally different measurement devices

Detalles Bibliográficos
Autores principales: Martini, M, Schönauer, Horst Otto, Ivanov, E
Lenguaje:eng
Publicado: 1993
Materias:
Acceso en línea:http://cds.cern.ch/record/250894
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author Martini, M
Schönauer, Horst Otto
Ivanov, E
author_facet Martini, M
Schönauer, Horst Otto
Ivanov, E
author_sort Martini, M
collection CERN
id cern-250894
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1993
record_format invenio
spelling cern-2508942021-11-11T09:55:48Zhttp://cds.cern.ch/record/250894engMartini, MSchönauer, Horst OttoIvanov, EMethods to compare and to obtain representative emittance values from fundamentally different measurement devicesAccelerators and Storage RingsCERN-PS-93-24-PAoai:cds.cern.ch:2508941993-06-23
spellingShingle Accelerators and Storage Rings
Martini, M
Schönauer, Horst Otto
Ivanov, E
Methods to compare and to obtain representative emittance values from fundamentally different measurement devices
title Methods to compare and to obtain representative emittance values from fundamentally different measurement devices
title_full Methods to compare and to obtain representative emittance values from fundamentally different measurement devices
title_fullStr Methods to compare and to obtain representative emittance values from fundamentally different measurement devices
title_full_unstemmed Methods to compare and to obtain representative emittance values from fundamentally different measurement devices
title_short Methods to compare and to obtain representative emittance values from fundamentally different measurement devices
title_sort methods to compare and to obtain representative emittance values from fundamentally different measurement devices
topic Accelerators and Storage Rings
url http://cds.cern.ch/record/250894
work_keys_str_mv AT martinim methodstocompareandtoobtainrepresentativeemittancevaluesfromfundamentallydifferentmeasurementdevices
AT schonauerhorstotto methodstocompareandtoobtainrepresentativeemittancevaluesfromfundamentallydifferentmeasurementdevices
AT ivanove methodstocompareandtoobtainrepresentativeemittancevaluesfromfundamentallydifferentmeasurementdevices