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Radiation tolerance of single-sided silicon microstrips
Autores principales: | Holmes-Siedle, A G, Hanneborg, A, Robbins, M, Watts, S, Allport, P P, Brenner, R, Moser, H G, Roe, S, Straver, J, Weilhammer, Peter, Chochula, P, Mikulec, I, Moszczynski, S, Turala, Michal, Dabrowski, W, Grybos, P, Idzik, M, Loukas, D, Misiakos, K, Siotis, I, Zachariadou, K, Dulinski, W, Michele, J, Schäffer, M, Turchetta, R, Booth, P, Richardson, J, Smith, N, Gill, K, Hall, G, Sachdeva, R, Sotthibandhu, S, Vitè, Davide F, Wheadon, R, Arrighi, C, Delpierre, P A, Habrard, M C, Clemens, J C, Mouthuy, T, Avset, B S, Evensen, L, Hansen, T A, Bisello, D, Giraldo, A, Paccagnella, A, Kurchaninov, L L, Spiriti, E, Apsimon, R J, Giubellino, P, Ramello, L, Prado da Silva, W L, Krammer, Manfred, Schuster, M |
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Lenguaje: | eng |
Publicado: |
1993
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/0168-9002(94)90188-0 http://cds.cern.ch/record/253229 |
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