Cargando…

Testing of re-lock time of HP G-link chip set

Detalles Bibliográficos
Autores principales: Sasaki, O, Andresen, J
Lenguaje:eng
Publicado: 1993
Materias:
Acceso en línea:http://cds.cern.ch/record/258353
_version_ 1780885960829960192
author Sasaki, O
Andresen, J
author_facet Sasaki, O
Andresen, J
author_sort Sasaki, O
collection CERN
id cern-258353
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1993
record_format invenio
spelling cern-2583532019-09-30T06:29:59Zhttp://cds.cern.ch/record/258353engSasaki, OAndresen, JTesting of re-lock time of HP G-link chip setDetectors and Experimental TechniquesKEK-Preprint-93-145SDC-598oai:cds.cern.ch:2583531993-11-09
spellingShingle Detectors and Experimental Techniques
Sasaki, O
Andresen, J
Testing of re-lock time of HP G-link chip set
title Testing of re-lock time of HP G-link chip set
title_full Testing of re-lock time of HP G-link chip set
title_fullStr Testing of re-lock time of HP G-link chip set
title_full_unstemmed Testing of re-lock time of HP G-link chip set
title_short Testing of re-lock time of HP G-link chip set
title_sort testing of re-lock time of hp g-link chip set
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/258353
work_keys_str_mv AT sasakio testingofrelocktimeofhpglinkchipset
AT andresenj testingofrelocktimeofhpglinkchipset