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The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP

Detalles Bibliográficos
Autor principal: Gross, E
Lenguaje:eng
Publicado: 1993
Materias:
Acceso en línea:http://cds.cern.ch/record/258563
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author Gross, E
author_facet Gross, E
author_sort Gross, E
collection CERN
id cern-258563
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1993
record_format invenio
spelling cern-2585632019-09-30T06:29:59Zhttp://cds.cern.ch/record/258563engGross, EThe use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEPDetectors and Experimental TechniquesWIS-93-85oai:cds.cern.ch:2585631993-08-25
spellingShingle Detectors and Experimental Techniques
Gross, E
The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP
title The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP
title_full The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP
title_fullStr The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP
title_full_unstemmed The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP
title_short The use of silicon microvertex detectors in measuring the $\tau$ lifetime at LEP
title_sort use of silicon microvertex detectors in measuring the $\tau$ lifetime at lep
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/258563
work_keys_str_mv AT grosse theuseofsiliconmicrovertexdetectorsinmeasuringthetaulifetimeatlep
AT grosse useofsiliconmicrovertexdetectorsinmeasuringthetaulifetimeatlep