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Noise characteristics of radiation-hard FETs for front-end electronics

Detalles Bibliográficos
Autores principales:	Karpinski, W, Lübelsmeyer, K, Pierschel, G, Rente, C, Tenbusch, F
Lenguaje:	eng
Publicado:	1994
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/259333

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