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Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
1993
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/260003 |
| _version_ | 1780886121233776640 |
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| author | Rahn, J T Geller, D Golden, D Grillo, A Sadrozinski, H F W |
| author_facet | Rahn, J T Geller, D Golden, D Grillo, A Sadrozinski, H F W |
| author_sort | Rahn, J T |
| collection | CERN |
| id | cern-260003 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1993 |
| record_format | invenio |
| spelling | cern-2600032019-09-30T06:29:59Zhttp://cds.cern.ch/record/260003engRahn, J TGeller, DGolden, DGrillo, ASadrozinski, H F WTesting the yield of an amplifier-discriminator chip fabricated in tektronix SHPiDetectors and Experimental TechniquesSCIPP-93-02oai:cds.cern.ch:2600031993 |
| spellingShingle | Detectors and Experimental Techniques Rahn, J T Geller, D Golden, D Grillo, A Sadrozinski, H F W Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi |
| title | Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi |
| title_full | Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi |
| title_fullStr | Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi |
| title_full_unstemmed | Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi |
| title_short | Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi |
| title_sort | testing the yield of an amplifier-discriminator chip fabricated in tektronix shpi |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/260003 |
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