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Testing the yield of an amplifier-discriminator chip fabricated in tektronix SHPi

Detalles Bibliográficos
Autores principales:	Rahn, J T, Geller, D, Golden, D, Grillo, A, Sadrozinski, H F W
Lenguaje:	eng
Publicado:	1993
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/260003

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