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Ellipsometry of functional organic surfaces and films

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional o...

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Detalles Bibliográficos
Autores principales: Hinrichs, Karsten, Eichhorn, Klaus-Jochen
Lenguaje:eng
Publicado: Springer 2018
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-75895-4
http://cds.cern.ch/record/2622016
_version_ 1780958537758801920
author Hinrichs, Karsten
Eichhorn, Klaus-Jochen
author_facet Hinrichs, Karsten
Eichhorn, Klaus-Jochen
author_sort Hinrichs, Karsten
collection CERN
description This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
id cern-2622016
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
publisher Springer
record_format invenio
spelling cern-26220162021-04-21T18:48:54Zdoi:10.1007/978-3-319-75895-4http://cds.cern.ch/record/2622016engHinrichs, KarstenEichhorn, Klaus-JochenEllipsometry of functional organic surfaces and filmsOther Fields of PhysicsEngineeringThis new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.Springeroai:cds.cern.ch:26220162018
spellingShingle Other Fields of Physics
Engineering
Hinrichs, Karsten
Eichhorn, Klaus-Jochen
Ellipsometry of functional organic surfaces and films
title Ellipsometry of functional organic surfaces and films
title_full Ellipsometry of functional organic surfaces and films
title_fullStr Ellipsometry of functional organic surfaces and films
title_full_unstemmed Ellipsometry of functional organic surfaces and films
title_short Ellipsometry of functional organic surfaces and films
title_sort ellipsometry of functional organic surfaces and films
topic Other Fields of Physics
Engineering
url https://dx.doi.org/10.1007/978-3-319-75895-4
http://cds.cern.ch/record/2622016
work_keys_str_mv AT hinrichskarsten ellipsometryoffunctionalorganicsurfacesandfilms
AT eichhornklausjochen ellipsometryoffunctionalorganicsurfacesandfilms