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Ellipsometry of functional organic surfaces and films
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional o...
| Autores principales: | , |
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| Lenguaje: | eng |
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Springer
2018
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| Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-75895-4 http://cds.cern.ch/record/2622016 |
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