Cargando…
Leakage current and defect characterization of short channel mosfets
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Logos
2012
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2622977 |
| _version_ | 1780958634207870976 |
|---|---|
| author | Roll, Guntrade |
| author_facet | Roll, Guntrade |
| author_sort | Roll, Guntrade |
| collection | CERN |
| id | cern-2622977 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2012 |
| publisher | Logos |
| record_format | invenio |
| spelling | cern-26229772021-04-21T18:48:02Zhttp://cds.cern.ch/record/2622977engRoll, GuntradeLeakage current and defect characterization of short channel mosfetsEngineeringLogosoai:cds.cern.ch:26229772012 |
| spellingShingle | Engineering Roll, Guntrade Leakage current and defect characterization of short channel mosfets |
| title | Leakage current and defect characterization of short channel mosfets |
| title_full | Leakage current and defect characterization of short channel mosfets |
| title_fullStr | Leakage current and defect characterization of short channel mosfets |
| title_full_unstemmed | Leakage current and defect characterization of short channel mosfets |
| title_short | Leakage current and defect characterization of short channel mosfets |
| title_sort | leakage current and defect characterization of short channel mosfets |
| topic | Engineering |
| url | http://cds.cern.ch/record/2622977 |
| work_keys_str_mv | AT rollguntrade leakagecurrentanddefectcharacterizationofshortchannelmosfets |