A Novel Radiation Hardened CAM

This poster describes an innovative Content Addressable Memory cell with radiation hardened (RH-CAM) architecture. The RH-CAM is designed in a commercial 28 nm CMOS technology. The circuit has been simulated in worst-case conditions, and the effects due to single particles are analyzed injecting a f...

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Detalles Bibliográficos
Autores principales: Shojaii, Seyed Ruhollah, Liberali, Valentino, Anagnostou, Oliver Ward, Mews, Michael John
Lenguaje:eng
Publicado: 2018
Materias:
Particle Physics - Experiment
Acceso en línea:http://cds.cern.ch/record/2625276
_version_ 1780958786728493056
author Shojaii, Seyed Ruhollah
Liberali, Valentino
Anagnostou, Oliver Ward
Mews, Michael John
author_facet Shojaii, Seyed Ruhollah
Liberali, Valentino
Anagnostou, Oliver Ward
Mews, Michael John
author_sort Shojaii, Seyed Ruhollah
collection CERN
description This poster describes an innovative Content Addressable Memory cell with radiation hardened (RH-CAM) architecture. The RH-CAM is designed in a commercial 28 nm CMOS technology. The circuit has been simulated in worst-case conditions, and the effects due to single particles are analyzed injecting a fault current into a circuit node. The proposed architecture can perform on-time pattern recognition tasks in harsh environments, such as very front-end electronics in hadron colliders and in space applications.
id cern-2625276
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling cern-26252762019-09-30T06:29:59Zhttp://cds.cern.ch/record/2625276engShojaii, Seyed RuhollahLiberali, ValentinoAnagnostou, Oliver WardMews, Michael JohnA Novel Radiation Hardened CAMParticle Physics - ExperimentThis poster describes an innovative Content Addressable Memory cell with radiation hardened (RH-CAM) architecture. The RH-CAM is designed in a commercial 28 nm CMOS technology. The circuit has been simulated in worst-case conditions, and the effects due to single particles are analyzed injecting a fault current into a circuit node. The proposed architecture can perform on-time pattern recognition tasks in harsh environments, such as very front-end electronics in hadron colliders and in space applications.ATL-DAQ-SLIDE-2018-397oai:cds.cern.ch:26252762018-06-22
spellingShingle Particle Physics - Experiment
Shojaii, Seyed Ruhollah
Liberali, Valentino
Anagnostou, Oliver Ward
Mews, Michael John
A Novel Radiation Hardened CAM
title A Novel Radiation Hardened CAM
title_full A Novel Radiation Hardened CAM
title_fullStr A Novel Radiation Hardened CAM
title_full_unstemmed A Novel Radiation Hardened CAM
title_short A Novel Radiation Hardened CAM
title_sort novel radiation hardened cam
topic Particle Physics - Experiment
url http://cds.cern.ch/record/2625276
work_keys_str_mv AT shojaiiseyedruhollah anovelradiationhardenedcam
AT liberalivalentino anovelradiationhardenedcam
AT anagnostouoliverward anovelradiationhardenedcam
AT mewsmichaeljohn anovelradiationhardenedcam
AT shojaiiseyedruhollah novelradiationhardenedcam
AT liberalivalentino novelradiationhardenedcam
AT anagnostouoliverward novelradiationhardenedcam
AT mewsmichaeljohn novelradiationhardenedcam

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