Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades

A precise and stable reference voltage is required to generate a stable output voltage in DC/DC converters. This reference voltage must be independent of temperature, power supply, radiation, intrinsic technology mismatch and process variation. This master's thesis reports the development of a...

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Autor principal: Besirli, Mustafa
Lenguaje:eng
Publicado: 2018
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/2627557
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author Besirli, Mustafa
author_facet Besirli, Mustafa
author_sort Besirli, Mustafa
collection CERN
description A precise and stable reference voltage is required to generate a stable output voltage in DC/DC converters. This reference voltage must be independent of temperature, power supply, radiation, intrinsic technology mismatch and process variation. This master's thesis reports the development of a rad-hard bandgap voltage reference with electrical fuse (eFuse) based analog calibration circuit in a commercial 130nm technology. According to the test results, the maximum error in the bandgap voltage (300mV in this application) was reduced from ±30mV to less than ±0.6mV thanks to the eFuse trimming. A temperature, power supply, radiation, mismatch and process-independent reference voltage was generated to provide reference voltage to first (bPOL12V) and second (bPOL2V5) stage DC/DC converters. This circuit will be integrated in bPOL12V and bPOL2V5 converters for high-luminosity LHC upgrades.
id cern-2627557
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling cern-26275572019-09-30T06:29:59Zhttp://cds.cern.ch/record/2627557engBesirli, MustafaDesign of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments UpgradesDetectors and Experimental TechniquesA precise and stable reference voltage is required to generate a stable output voltage in DC/DC converters. This reference voltage must be independent of temperature, power supply, radiation, intrinsic technology mismatch and process variation. This master's thesis reports the development of a rad-hard bandgap voltage reference with electrical fuse (eFuse) based analog calibration circuit in a commercial 130nm technology. According to the test results, the maximum error in the bandgap voltage (300mV in this application) was reduced from ±30mV to less than ±0.6mV thanks to the eFuse trimming. A temperature, power supply, radiation, mismatch and process-independent reference voltage was generated to provide reference voltage to first (bPOL12V) and second (bPOL2V5) stage DC/DC converters. This circuit will be integrated in bPOL12V and bPOL2V5 converters for high-luminosity LHC upgrades.CERN-THESIS-2018-084oai:cds.cern.ch:26275572018-06-29T12:01:01Z
spellingShingle Detectors and Experimental Techniques
Besirli, Mustafa
Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades
title Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades
title_full Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades
title_fullStr Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades
title_full_unstemmed Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades
title_short Design of a Rad-Hard eFuse Trimming Circuit for Bandgap Voltage Reference for LHC Experiments Upgrades
title_sort design of a rad-hard efuse trimming circuit for bandgap voltage reference for lhc experiments upgrades
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/2627557
work_keys_str_mv AT besirlimustafa designofaradhardefusetrimmingcircuitforbandgapvoltagereferenceforlhcexperimentsupgrades

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