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Comparison of 35 and 50 ${\mu}$m thin HPK UFSD after neutron irradiation up to $6•10^15$ $neq/cm^2$
We report results from the testing of 35 μ m thick Ultra-Fast Silicon Detectors (UFSD) produced by Hamamatsu Photonics (HPK), Japan and the comparison of these new results to data reported in a previous paper on 50 μ m thick UFSD produced by HPK. The 35 μ m thick sensors were irradiated with neutron...
Autores principales: | Zhao, Y., Cartiglia, N., Estrada, E., Galloway, Z., Gee, C., Goto, A., Luce, Z., Mazza, S.M., Mckinney-Martinez, F., Rodriguez, R., Sadrozinski, H.F.-W., Seiden, A., Cindro, V., Kramberger, G., Mandić, I., Mikuž, M., Zavrtanik, M. |
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Formato: | info:eu-repo/semantics/article |
Lenguaje: | eng |
Publicado: |
Nucl. Instrum. Methods Phys. Res., A
2018
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2018.08.040 http://cds.cern.ch/record/2633859 |
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