Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)

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The phase II readout chip (RoC) for Si-detectors generates a significant amount of heat during operation, typically around 2W but hypothetically up to 8W. For the purposes of in-lab testing, I developed a temperature control system for the chip based on a Peltier chiller and a control loop. I descri...

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Autor principal: D'Andrea, Mario
Lenguaje:eng
Publicado: 2018
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/2634868
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author D'Andrea, Mario
author_facet D'Andrea, Mario
author_sort D'Andrea, Mario
collection CERN
description The phase II readout chip (RoC) for Si-detectors generates a significant amount of heat during operation, typically around 2W but hypothetically up to 8W. For the purposes of in-lab testing, I developed a temperature control system for the chip based on a Peltier chiller and a control loop. I describe the implementation details of the system along with some metrics of the system's performance. This report is intended as an in-lab guide for those who will be using the system.
id cern-2634868
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling cern-26348682019-09-30T06:29:59Zhttp://cds.cern.ch/record/2634868engD'Andrea, MarioTemperature Control When Testing the RD53 Chip in the Lab (Technical Report)EngineeringThe phase II readout chip (RoC) for Si-detectors generates a significant amount of heat during operation, typically around 2W but hypothetically up to 8W. For the purposes of in-lab testing, I developed a temperature control system for the chip based on a Peltier chiller and a control loop. I describe the implementation details of the system along with some metrics of the system's performance. This report is intended as an in-lab guide for those who will be using the system.CERN-STUDENTS-Note-2018-054oai:cds.cern.ch:26348682018-08-18
spellingShingle Engineering
D'Andrea, Mario
Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
title Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
title_full Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
title_fullStr Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
title_full_unstemmed Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
title_short Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
title_sort temperature control when testing the rd53 chip in the lab (technical report)
topic Engineering
url http://cds.cern.ch/record/2634868
work_keys_str_mv AT dandreamario temperaturecontrolwhentestingtherd53chipinthelabtechnicalreport

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