Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)

The phase II readout chip (RoC) for Si-detectors generates a significant amount of heat during operation, typically around 2W but hypothetically up to 8W. For the purposes of in-lab testing, I developed a temperature control system for the chip based on a Peltier chiller and a control loop. I describe the implementation details of the system along with some metrics of the system's performance. This report is intended as an in-lab guide for those who will be using the system.