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Temperature Control When Testing the RD53 Chip in the Lab (Technical Report)
The phase II readout chip (RoC) for Si-detectors generates a significant amount of heat during operation, typically around 2W but hypothetically up to 8W. For the purposes of in-lab testing, I developed a temperature control system for the chip based on a Peltier chiller and a control loop. I descri...
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| Lenguaje: | eng |
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1996
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| Acceso en línea: | http://cds.cern.ch/record/2634869 |
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