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Testing system for OBDT production
The Muon Drift Tube(MDT) will be continuously used for the High Luminosity LHC, the high luminosity data taking period with the upgraded LHC. Although the MDT will be continuously used, the electronics of the MDT will be upgraded during the shutdown, due to the increase of the data rate and radiat...
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Lenguaje: | eng |
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2018
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Acceso en línea: | http://cds.cern.ch/record/2636676 |
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author | Mino, Yuya |
author_facet | Mino, Yuya |
author_sort | Mino, Yuya |
collection | CERN |
description | The Muon Drift Tube(MDT) will be continuously used for the High Luminosity LHC, the high luminosity data taking period with the upgraded LHC. Although the MDT will be continuously used, the electronics of the MDT will be upgraded during the shutdown, due to the increase of the data rate and radiation. The board on the detector used as a TDC(Time-to-digital converter) to get the time information of the MDT will be exchanged to OBDT(On-Board electronics for DT boards) for the Phase-2. About 1000 OBDT‘s will be made for the MDT in the CMS. However, the OBDT‘s must be tested to qualify the production of the OBDT. To make the board test efficient, a firmware will be prepared. During the Summer Student Program for 10 weeks, my task was to make the firmware for testing the input of the OBDT. |
id | cern-2636676 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2018 |
record_format | invenio |
spelling | cern-26366762019-09-30T06:29:59Zhttp://cds.cern.ch/record/2636676engMino, YuyaTesting system for OBDT productionEngineering The Muon Drift Tube(MDT) will be continuously used for the High Luminosity LHC, the high luminosity data taking period with the upgraded LHC. Although the MDT will be continuously used, the electronics of the MDT will be upgraded during the shutdown, due to the increase of the data rate and radiation. The board on the detector used as a TDC(Time-to-digital converter) to get the time information of the MDT will be exchanged to OBDT(On-Board electronics for DT boards) for the Phase-2. About 1000 OBDT‘s will be made for the MDT in the CMS. However, the OBDT‘s must be tested to qualify the production of the OBDT. To make the board test efficient, a firmware will be prepared. During the Summer Student Program for 10 weeks, my task was to make the firmware for testing the input of the OBDT. CERN-STUDENTS-Note-2018-086oai:cds.cern.ch:26366762018-08-30 |
spellingShingle | Engineering Mino, Yuya Testing system for OBDT production |
title | Testing system for OBDT production |
title_full | Testing system for OBDT production |
title_fullStr | Testing system for OBDT production |
title_full_unstemmed | Testing system for OBDT production |
title_short | Testing system for OBDT production |
title_sort | testing system for obdt production |
topic | Engineering |
url | http://cds.cern.ch/record/2636676 |
work_keys_str_mv | AT minoyuya testingsystemforobdtproduction |