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Testing system for OBDT production

The Muon Drift Tube(MDT) will be continuously used for the High Luminosity LHC, the high luminosity data taking period with the upgraded LHC. Although the MDT will be continuously used, the electronics of the MDT will be upgraded during the shutdown, due to the increase of the data rate and radiat...

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Autor principal: Mino, Yuya
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2636676
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author Mino, Yuya
author_facet Mino, Yuya
author_sort Mino, Yuya
collection CERN
description The Muon Drift Tube(MDT) will be continuously used for the High Luminosity LHC, the high luminosity data taking period with the upgraded LHC. Although the MDT will be continuously used, the electronics of the MDT will be upgraded during the shutdown, due to the increase of the data rate and radiation. The board on the detector used as a TDC(Time-to-digital converter) to get the time information of the MDT will be exchanged to OBDT(On-Board electronics for DT boards) for the Phase-2. About 1000 OBDT‘s will be made for the MDT in the CMS. However, the OBDT‘s must be tested to qualify the production of the OBDT. To make the board test efficient, a firmware will be prepared. During the Summer Student Program for 10 weeks, my task was to make the firmware for testing the input of the OBDT.
id cern-2636676
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2018
record_format invenio
spelling cern-26366762019-09-30T06:29:59Zhttp://cds.cern.ch/record/2636676engMino, YuyaTesting system for OBDT productionEngineering The Muon Drift Tube(MDT) will be continuously used for the High Luminosity LHC, the high luminosity data taking period with the upgraded LHC. Although the MDT will be continuously used, the electronics of the MDT will be upgraded during the shutdown, due to the increase of the data rate and radiation. The board on the detector used as a TDC(Time-to-digital converter) to get the time information of the MDT will be exchanged to OBDT(On-Board electronics for DT boards) for the Phase-2. About 1000 OBDT‘s will be made for the MDT in the CMS. However, the OBDT‘s must be tested to qualify the production of the OBDT. To make the board test efficient, a firmware will be prepared. During the Summer Student Program for 10 weeks, my task was to make the firmware for testing the input of the OBDT. CERN-STUDENTS-Note-2018-086oai:cds.cern.ch:26366762018-08-30
spellingShingle Engineering
Mino, Yuya
Testing system for OBDT production
title Testing system for OBDT production
title_full Testing system for OBDT production
title_fullStr Testing system for OBDT production
title_full_unstemmed Testing system for OBDT production
title_short Testing system for OBDT production
title_sort testing system for obdt production
topic Engineering
url http://cds.cern.ch/record/2636676
work_keys_str_mv AT minoyuya testingsystemforobdtproduction