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Depleted Fully Monolithic Active CMOS Pixel Sensors (DMAPS) in High Resistivity 150~nm Technology for LHC

Depleted monolithic CMOS 1 1 Complementary metal-oxide-semiconductor.  active pixel sensors (DMAPS) have been developed to demonstrate their suitability as pixel detectors in the outer layers of the ATLAS Inner Tracker (ITk) pixel detector in the High-Luminosity Large Hadron Collider (HL-LHC). Two p...

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Detalles Bibliográficos
Autores principales: Hirono, Toko, Barbero, Marlon, Barrillon, Pierre, Bhat, Siddharth, Breugnon, Patrick, Caicedo, Ivan, Chen, Zongde, Daas, Michael, Degerli, Yavuz, Godiot, Stephanie, Guilloux, Fabrice, Hemperek, Tomasz, Hugging, Fabian, Kruger, Hans, Pangaud, Patrick, Rymaszewski, Piotr, Schwemling, Philippe, Vandenbroucke, Maxence, Wang, Tianyang, Wermes, Norbert
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: Nucl. Instrum. Methods Phys. Res., A 2018
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2018.10.059
http://cds.cern.ch/record/2641635
Descripción
Sumario:Depleted monolithic CMOS 1 1 Complementary metal-oxide-semiconductor.  active pixel sensors (DMAPS) have been developed to demonstrate their suitability as pixel detectors in the outer layers of the ATLAS Inner Tracker (ITk) pixel detector in the High-Luminosity Large Hadron Collider (HL-LHC). Two prototypes have been fabricated using a 150 nm CMOS technology on high resistivity ( ≥  2 k Ω cm) wafers. The chip size of 10 mm  ×  10 mm is similar to that of the current FE-I3 ATLAS pixel detector readout chip. One of the prototypes is used for detailed characterization of the sensor and analog front end circuitry of the DMAPS. The other one is a fully monolithic DMAPS, including fast readout digital logics that handle the required hit rate. To yield a strong homogeneous electric field within the sensor volume, back-side process of the wafer was tested. The prototypes were irradiated with X-rays up to a total ionization dose (TID) of 50 Mrad(SiO 2 ) and with neutrons up to a 1 MeV neutron equivalent fluence of 10 15  n eq /cm 2 to test non-ionizing energy loss (NIEL) effects. The analog front end circuitry maintained its performance after TID irradiation, and the hit efficiency at < 10 −7 noise occupancy was as high as 98.9% after NIEL irradiation.