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Fine-Calibration of Pixel Detector

The aim of this project was to calibrate the new CMOS pixel sensor by using X-Ray fluorescence experimental setup. Since the setup produces well-defined monochromatic energy spectra of X-Rays, the number of electron-hole (e-h) pairs in the silicon detector can be calculated. Changing threshold voltage...

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Detalles Bibliográficos
Autor principal: Steponavicius, Tomas
Lenguaje:eng
Publicado: 2018
Materias:
Acceso en línea:http://cds.cern.ch/record/2644697
Descripción
Sumario:The aim of this project was to calibrate the new CMOS pixel sensor by using X-Ray fluorescence experimental setup. Since the setup produces well-defined monochromatic energy spectra of X-Rays, the number of electron-hole (e-h) pairs in the silicon detector can be calculated. Changing threshold voltage (Vth) of the detector enables us to vary the amount of detectable e-h pairs. However, the noise of electrical origin increases considerably with lower Vth. Different noise-removal techniques have been implemented to obtain X-Ray fluorescence signal.