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Characterization of Cd implanted and annealed GaAs and InP by perturbed angular correlation (PAC) spectroscopy

Detalles Bibliográficos
Autores principales:	Pfeiffer, Wolfgang, Deicher, M, Keller, R, Magerle, R, Pross, P, Skudlik, H, Wichert, T, Wolf, H, Forkel-Wirth, Doris, Moriya, N, Kalish, R
Lenguaje:	eng
Publicado:	1991
Materias:	Other Fields of Physics
Acceso en línea:	https://dx.doi.org/10.1016/0169-4332(91)90155-D http://cds.cern.ch/record/264862

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