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Measurement of Single Event Upset rates in single pixels of ATLAS IBL
Techniques have been developed to determine the single upset rates in individual pixels in the innermost layer of the ATLAS pixel detector, called IBL. SIngle pixel SEU cannot be observed directly through error reporting of the pixels as there is no such function, nor is there real time monitoring o...
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| Lenguaje: | eng |
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2018
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| Acceso en línea: | http://cds.cern.ch/record/2650057 |