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Dark count rate of silicon photomultipliers: metrological characterization and suppression

Detalles Bibliográficos
Autor principal:	Engelmann, Eugen
Lenguaje:	eng
Publicado:	Cuvillier Verlag 2018
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2653961

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