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Lock-in thermography: basics and use for evaluating electronic devices and materials
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2018
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-99825-1 http://cds.cern.ch/record/2657859 |