Single Event Upsets in the ATLAS IBL Frontend ASICs

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The single event effects like Single Event Upset (SEU) and Single Event Transient (SET) are big concerns in the detector operation in high radiation environment. The Insertable B-Layer (IBL) is the innermost layer in the ATLAS, which was installed at radius of 3.3 cm from the beam axis in 2014. As a...

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Detalles Bibliográficos
Autor principal: Takubo, Yosuke
Lenguaje:eng
Publicado: 2019
Materias:
Particle Physics - Experiment
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/14/11/C11004
http://cds.cern.ch/record/2663244
Descripción
Sumario:The single event effects like Single Event Upset (SEU) and Single Event Transient (SET) are big concerns in the detector operation in high radiation environment. The Insertable B-Layer (IBL) is the innermost layer in the ATLAS, which was installed at radius of 3.3 cm from the beam axis in 2014. As an instantaneous luminosity at the LHC increases, the single event effects were being more visible in the operation of the IBL. In this paper, studies of the single event effects on the front-end ASICs used for the IBL will be described.

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