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Contactless VLSI measurement and testing techniques
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Springer
2017
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2663555 |
| _version_ | 1780961736861417472 |
|---|---|
| author | Sayil, Selahattin |
| author_facet | Sayil, Selahattin |
| author_sort | Sayil, Selahattin |
| collection | CERN |
| id | cern-2663555 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2017 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-26635552021-04-21T18:30:36Zhttp://cds.cern.ch/record/2663555engSayil, SelahattinContactless VLSI measurement and testing techniquesEngineeringSpringeroai:cds.cern.ch:26635552017 |
| spellingShingle | Engineering Sayil, Selahattin Contactless VLSI measurement and testing techniques |
| title | Contactless VLSI measurement and testing techniques |
| title_full | Contactless VLSI measurement and testing techniques |
| title_fullStr | Contactless VLSI measurement and testing techniques |
| title_full_unstemmed | Contactless VLSI measurement and testing techniques |
| title_short | Contactless VLSI measurement and testing techniques |
| title_sort | contactless vlsi measurement and testing techniques |
| topic | Engineering |
| url | http://cds.cern.ch/record/2663555 |
| work_keys_str_mv | AT sayilselahattin contactlessvlsimeasurementandtestingtechniques |