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Phase change memory: device physics, reliability and applications
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Springer
2017
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2663559 |
| _version_ | 1780961737721249792 |
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| author | Redaelli, Andrea |
| author_facet | Redaelli, Andrea |
| author_sort | Redaelli, Andrea |
| collection | CERN |
| id | cern-2663559 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2017 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-26635592021-04-21T18:30:36Zhttp://cds.cern.ch/record/2663559engRedaelli, AndreaPhase change memory: device physics, reliability and applicationsPhysics in generalSpringeroai:cds.cern.ch:26635592017 |
| spellingShingle | Physics in general Redaelli, Andrea Phase change memory: device physics, reliability and applications |
| title | Phase change memory: device physics, reliability and applications |
| title_full | Phase change memory: device physics, reliability and applications |
| title_fullStr | Phase change memory: device physics, reliability and applications |
| title_full_unstemmed | Phase change memory: device physics, reliability and applications |
| title_short | Phase change memory: device physics, reliability and applications |
| title_sort | phase change memory: device physics, reliability and applications |
| topic | Physics in general |
| url | http://cds.cern.ch/record/2663559 |
| work_keys_str_mv | AT redaelliandrea phasechangememorydevicephysicsreliabilityandapplications |