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Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip

The phase-2 upgrade of the LHC will require novel pixel readout chips, which deliver hit information at drastically increased data rates and tolerate unprecedented radiation levels. The large-scale prototype chip RD53A has been designed by the RD53 collaboration and manufactured in a 65 nm CMOS proc...

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Detalles Bibliográficos
Autor principal: Vogt, M.
Lenguaje:eng
Publicado: 2019
Materias:
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/14/05/C05018
http://cds.cern.ch/record/2671502
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author Vogt, M.
author_facet Vogt, M.
author_sort Vogt, M.
collection CERN
description The phase-2 upgrade of the LHC will require novel pixel readout chips, which deliver hit information at drastically increased data rates and tolerate unprecedented radiation levels. The large-scale prototype chip RD53A has been designed by the RD53 collaboration and manufactured in a 65 nm CMOS process, suitable for the innermost layers of both the ATLAS and the CMS experiment. In order to verify the radiation hardness design goal of 500 Mrad total ionizing dose, RD53A has been irradiated using X-rays. The radiation effects on the performance of the data link, reset circuit and the clock generation have been investigated. Furthermore, the operating margins in terms of supply voltage and frequency have been analyzed.
id cern-2671502
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2019
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spelling cern-26715022019-09-30T06:29:59Zdoi:10.1088/1748-0221/14/05/C05018http://cds.cern.ch/record/2671502engVogt, M.Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chipphysics.ins-detDetectors and Experimental TechniquesThe phase-2 upgrade of the LHC will require novel pixel readout chips, which deliver hit information at drastically increased data rates and tolerate unprecedented radiation levels. The large-scale prototype chip RD53A has been designed by the RD53 collaboration and manufactured in a 65 nm CMOS process, suitable for the innermost layers of both the ATLAS and the CMS experiment. In order to verify the radiation hardness design goal of 500 Mrad total ionizing dose, RD53A has been irradiated using X-rays. The radiation effects on the performance of the data link, reset circuit and the clock generation have been investigated. Furthermore, the operating margins in terms of supply voltage and frequency have been analyzed.arXiv:1903.08010oai:cds.cern.ch:26715022019-03-19
spellingShingle physics.ins-det
Detectors and Experimental Techniques
Vogt, M.
Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip
title Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip
title_full Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip
title_fullStr Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip
title_full_unstemmed Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip
title_short Radiation-induced Effects on Data Integrity and Link Stability of the RD53A Pixel Readout Chip
title_sort radiation-induced effects on data integrity and link stability of the rd53a pixel readout chip
topic physics.ins-det
Detectors and Experimental Techniques
url https://dx.doi.org/10.1088/1748-0221/14/05/C05018
http://cds.cern.ch/record/2671502
work_keys_str_mv AT vogtm radiationinducedeffectsondataintegrityandlinkstabilityoftherd53apixelreadoutchip