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Harsh environment electronics: interconnect materials and performance assessment
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
John Wiley & Sons
2019
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2675571 |
| _version_ | 1780962658901557248 |
|---|---|
| author | Sharif, Ahmed |
| author_facet | Sharif, Ahmed |
| author_sort | Sharif, Ahmed |
| collection | CERN |
| id | cern-2675571 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2019 |
| publisher | John Wiley & Sons |
| record_format | invenio |
| spelling | cern-26755712021-04-21T18:24:36Zhttp://cds.cern.ch/record/2675571engSharif, AhmedHarsh environment electronics: interconnect materials and performance assessmentEngineeringJohn Wiley & Sonsoai:cds.cern.ch:26755712019 |
| spellingShingle | Engineering Sharif, Ahmed Harsh environment electronics: interconnect materials and performance assessment |
| title | Harsh environment electronics: interconnect materials and performance assessment |
| title_full | Harsh environment electronics: interconnect materials and performance assessment |
| title_fullStr | Harsh environment electronics: interconnect materials and performance assessment |
| title_full_unstemmed | Harsh environment electronics: interconnect materials and performance assessment |
| title_short | Harsh environment electronics: interconnect materials and performance assessment |
| title_sort | harsh environment electronics: interconnect materials and performance assessment |
| topic | Engineering |
| url | http://cds.cern.ch/record/2675571 |
| work_keys_str_mv | AT sharifahmed harshenvironmentelectronicsinterconnectmaterialsandperformanceassessment |