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Screening and Reliability Testing of Beam Loss Monitor Electronics at CERN
A new processing board (VFC-HD) was developed for the Beam Loss Monitoring system at CERN with the purpose to increase the system performance. To fulfil defined reliability requirements during the operation, a screening strategy is defined. Validation tests of pre-series boards during the design...
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| Lenguaje: | eng |
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2019
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| Acceso en línea: | http://cds.cern.ch/record/2676130 |