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Understanding of the beam emittance evolution during SB
Lumi days 2019 presentation. Indico https://indico.cern.ch/event/813285/timetable/ CMS emittance scans can be used to measure emittance evolution of the beam. As CMS crossing plane is in X there is bias in the measurement due non-Gaussian shape on the longitudinal profile. Also comparison of the CMS...
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| Lenguaje: | eng |
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2019
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| Acceso en línea: | http://cds.cern.ch/record/2681802 |