| _version_ |
1780964120376377344
|
| collection |
CERN
|
| id |
cern-2695141
|
| institution |
Organización Europea para la Investigación Nuclear
|
| language |
eng
|
| publishDate |
2019
|
| record_format |
invenio
|
| spelling |
cern-26951412019-10-22T19:59:09Zhttp://cds.cern.ch/record/2695141eng31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)oai:cds.cern.ch:26951412019
|
| spellingShingle |
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)
|
| title |
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)
|
| title_full |
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)
|
| title_fullStr |
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)
|
| title_full_unstemmed |
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)
|
| title_short |
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT2018)
|
| title_sort |
31st ieee international symposium on defect and fault tolerance in vlsi and nanotechnology systems (dft2018)
|
| url |
http://cds.cern.ch/record/2695141
|
