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Parasitic substrate coupling in high voltage integrated circuits: minority and majority carriers propagation in semiconductor substrate

Detalles Bibliográficos
Autores principales:	Buccella, Pietro, Stefanucci, Camillo, Kayal, Maher, Sallese, Jean-Michel
Lenguaje:	eng
Publicado:	Springer 2018
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2698055

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