Cargando…
Validation radiation damage model with data comparison
Autores principales: | Passeri, D, Morozzi, A |
---|---|
Formato: | info:eu-repo/semantics/article |
Lenguaje: | eng |
Publicado: |
2019
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2705362 |
Ejemplares similares
-
TCAD radiation damage model
por: Passeri, D, et al.
Publicado: (2020) -
TCAD advanced radiation damage modelling in silicon detectors
por: Morozzi, A., et al.
Publicado: (2020) -
Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations
por: Moscatelli, F, et al.
Publicado: (2016) -
Measurements and TCAD Simulations of Bulk and Surface Radiation Damage Effects
por: F. Moscatelli, et al.
Publicado: (2016) -
Modeling of Radiation Damage Effects in Silicon Detectors at High Fluences HL-LHC with Sentaurus TCAD
por: Passeri, D., et al.
Publicado: (2016)