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X-ray microscopy

Detalles Bibliográficos
Autor principal:	Jacobsen, Chris
Lenguaje:	eng
Publicado:	Cambridge University Press 2019
Materias:	Other Fields of Physics
Acceso en línea:	https://dx.doi.org/10.1017/9781139924542 http://cds.cern.ch/record/2705468

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