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Microelectronics fialure analysis desk reference
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
A S M International
2019
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2707553 |
_version_ | 1780964953975422976 |
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author | Gandhi, Tejinder |
author_facet | Gandhi, Tejinder |
author_sort | Gandhi, Tejinder |
collection | CERN |
id | cern-2707553 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2019 |
publisher | A S M International |
record_format | invenio |
spelling | cern-27075532021-04-21T18:11:04Zhttp://cds.cern.ch/record/2707553engGandhi, TejinderMicroelectronics fialure analysis desk referenceEngineeringA S M Internationaloai:cds.cern.ch:27075532019 |
spellingShingle | Engineering Gandhi, Tejinder Microelectronics fialure analysis desk reference |
title | Microelectronics fialure analysis desk reference |
title_full | Microelectronics fialure analysis desk reference |
title_fullStr | Microelectronics fialure analysis desk reference |
title_full_unstemmed | Microelectronics fialure analysis desk reference |
title_short | Microelectronics fialure analysis desk reference |
title_sort | microelectronics fialure analysis desk reference |
topic | Engineering |
url | http://cds.cern.ch/record/2707553 |
work_keys_str_mv | AT gandhitejinder microelectronicsfialureanalysisdeskreference |