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Long term reverse annealing in silicon detectors
The methods of isothermal and isochronal heat treatments have been used for further studies of the reverse annealing effect of the effective impurity concentration. These measurements lead to an improved reliability of a second order model, which was already proposed in earlier works. Using only thr...
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1994
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/23.322808 http://cds.cern.ch/record/271012 |