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Low substrate temperature modeling outlook of scaled n-MOSFET

Detalles Bibliográficos
Autores principales:	Ashraf, Nabil Shovon, Iniewski, Kris
Lenguaje:	eng
Publicado:	Morgan & Claypool Publishers 2018
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2713848

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