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Characterisation and control of defects in semiconductors
This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.
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| Lenguaje: | eng |
| Publicado: |
Institution of Engineering & Technology
2019
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2716614 |
| _version_ | 1780965489663541248 |
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| author | Tuomisto, Filip |
| author_facet | Tuomisto, Filip |
| author_sort | Tuomisto, Filip |
| collection | CERN |
| description | This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors. |
| id | cern-2716614 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2019 |
| publisher | Institution of Engineering & Technology |
| record_format | invenio |
| spelling | cern-27166142021-04-21T18:08:48Zhttp://cds.cern.ch/record/2716614engTuomisto, FilipCharacterisation and control of defects in semiconductorsEngineeringThis book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.Institution of Engineering & Technologyoai:cds.cern.ch:27166142019 |
| spellingShingle | Engineering Tuomisto, Filip Characterisation and control of defects in semiconductors |
| title | Characterisation and control of defects in semiconductors |
| title_full | Characterisation and control of defects in semiconductors |
| title_fullStr | Characterisation and control of defects in semiconductors |
| title_full_unstemmed | Characterisation and control of defects in semiconductors |
| title_short | Characterisation and control of defects in semiconductors |
| title_sort | characterisation and control of defects in semiconductors |
| topic | Engineering |
| url | http://cds.cern.ch/record/2716614 |
| work_keys_str_mv | AT tuomistofilip characterisationandcontrolofdefectsinsemiconductors |