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Characterisation and control of defects in semiconductors
This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.
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| Lenguaje: | eng |
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Institution of Engineering & Technology
2019
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| Acceso en línea: | http://cds.cern.ch/record/2716614 |