Advances in imaging and electron physics: optics of charged particle analyzers

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Autor principal: Hawkes, Peter W
Lenguaje:eng
Publicado: Elsevier Science & Technology 2010
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2716724

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