Cargando…
Advances in imaging and electron physics: optics of charged particle analyzers
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Elsevier Science & Technology
2010
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2716725 |
Search Result 1
Search Result 2
Search Result 3