Measurements of Single Event Upset in ATLAS IBL

Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops i...

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Detalles Bibliográficos
Autores principales: Balbi, G., Barbero, M., Beccherle, R., Bindi, M., Breugnon, P., Butti, P., Cinca, D., Dickinson, J., Ferrere, D., Fougeron, D., Garcia-Sciveres, M., Garcia Pascual, J., Gaudiello, A., Gemme, C., Giangiacomi, N., Hemperek, T., Jeanty, L., Kepka, O., Kocian, M., Lantzsch, K., Liu, P., Martin, C., Mekkaoui, A., Menouni, M., Potamianos, K., Rozanov, A., Takubo, Y., Wensing., M.
Lenguaje:eng
Publicado: 2020
Materias:
hep-ex
Particle Physics - Experiment
physics.ins-det
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1088/1748-0221/15/06/P06023
http://cds.cern.ch/record/2717115
Descripción
Sumario:Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.

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