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Measurements of Single Event Upset in ATLAS IBL
Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops i...
| Autores principales: | , , , , , , , , , , , , , , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2020
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1088/1748-0221/15/06/P06023 http://cds.cern.ch/record/2717115 |
| _version_ | 1780965573791842304 |
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| author | Balbi, G. Barbero, M. Beccherle, R. Bindi, M. Breugnon, P. Butti, P. Cinca, D. Dickinson, J. Ferrere, D. Fougeron, D. Garcia-Sciveres, M. Garcia Pascual, J. Gaudiello, A. Gemme, C. Giangiacomi, N. Hemperek, T. Jeanty, L. Kepka, O. Kocian, M. Lantzsch, K. Liu, P. Martin, C. Mekkaoui, A. Menouni, M. Potamianos, K. Rozanov, A. Takubo, Y. Wensing., M. |
| author_facet | Balbi, G. Barbero, M. Beccherle, R. Bindi, M. Breugnon, P. Butti, P. Cinca, D. Dickinson, J. Ferrere, D. Fougeron, D. Garcia-Sciveres, M. Garcia Pascual, J. Gaudiello, A. Gemme, C. Giangiacomi, N. Hemperek, T. Jeanty, L. Kepka, O. Kocian, M. Lantzsch, K. Liu, P. Martin, C. Mekkaoui, A. Menouni, M. Potamianos, K. Rozanov, A. Takubo, Y. Wensing., M. |
| author_sort | Balbi, G. |
| collection | CERN |
| description | Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented. |
| id | cern-2717115 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2020 |
| record_format | invenio |
| spelling | cern-27171152021-11-27T03:38:01Zdoi:10.1088/1748-0221/15/06/P06023http://cds.cern.ch/record/2717115engBalbi, G.Barbero, M.Beccherle, R.Bindi, M.Breugnon, P.Butti, P.Cinca, D.Dickinson, J.Ferrere, D.Fougeron, D.Garcia-Sciveres, M.Garcia Pascual, J.Gaudiello, A.Gemme, C.Giangiacomi, N.Hemperek, T.Jeanty, L.Kepka, O.Kocian, M.Lantzsch, K.Liu, P.Martin, C.Mekkaoui, A.Menouni, M.Potamianos, K.Rozanov, A.Takubo, Y.Wensing., M.Measurements of Single Event Upset in ATLAS IBLhep-exParticle Physics - Experimentphysics.ins-detDetectors and Experimental TechniquesEffects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.arXiv:2004.14116oai:cds.cern.ch:27171152020-04-29 |
| spellingShingle | hep-ex Particle Physics - Experiment physics.ins-det Detectors and Experimental Techniques Balbi, G. Barbero, M. Beccherle, R. Bindi, M. Breugnon, P. Butti, P. Cinca, D. Dickinson, J. Ferrere, D. Fougeron, D. Garcia-Sciveres, M. Garcia Pascual, J. Gaudiello, A. Gemme, C. Giangiacomi, N. Hemperek, T. Jeanty, L. Kepka, O. Kocian, M. Lantzsch, K. Liu, P. Martin, C. Mekkaoui, A. Menouni, M. Potamianos, K. Rozanov, A. Takubo, Y. Wensing., M. Measurements of Single Event Upset in ATLAS IBL |
| title | Measurements of Single Event Upset in ATLAS IBL |
| title_full | Measurements of Single Event Upset in ATLAS IBL |
| title_fullStr | Measurements of Single Event Upset in ATLAS IBL |
| title_full_unstemmed | Measurements of Single Event Upset in ATLAS IBL |
| title_short | Measurements of Single Event Upset in ATLAS IBL |
| title_sort | measurements of single event upset in atlas ibl |
| topic | hep-ex Particle Physics - Experiment physics.ins-det Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1088/1748-0221/15/06/P06023 http://cds.cern.ch/record/2717115 |
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