Experimental Study of Acceptor Removal in UFSD

The performance of the Ultra-Fast Silicon Detectors (UFSD) after irradiation with neutrons and protons is compromised by the removal of acceptors in the thin layer below the junction responsible for the gain. This effect is tested both with capacitance – voltage, C-V, measurements of the doping conc...

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Autores principales: Sadrozinski, H. F.-W., Jin, Y., Ren, H., Christie, S., Galloway, Z., Gee, C., Labitan, C., Lockerby, M., Martinez-McKinney, F., Mazza, S. M., Padilla, R., Schumm, B., Seiden, A., Wilder, M., Wyatt, W., Zhao, Y., Arcidiacono, R., Cartiglia, N., Ferrero, M., Mandurrino, M., Siviero, F., Sola, V., Tornago, M., Cindro, V., Howard, A., Kramberger, G., Mandić, I., Mikuž, M.
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: Nucl. Instrum. Methods Phys. Res., A 2020
Materias:
Detectors and Experimental Techniques
7: Advanced hybrid pixel detectors
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2020.164611
http://cds.cern.ch/record/2718058
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author Sadrozinski, H. F.-W.
Jin, Y.
Ren, H.
Christie, S.
Galloway, Z.
Gee, C.
Labitan, C.
Lockerby, M.
Martinez-McKinney, F.
Mazza, S. M.
Padilla, R.
Schumm, B.
Seiden, A.
Wilder, M.
Wyatt, W.
Zhao, Y.
Arcidiacono, R.
Cartiglia, N.
Ferrero, M.
Mandurrino, M.
Siviero, F.
Sola, V.
Tornago, M.
Cindro, V.
Howard, A.
Kramberger, G.
Mandić, I.
Mikuž, M.
author_facet Sadrozinski, H. F.-W.
Jin, Y.
Ren, H.
Christie, S.
Galloway, Z.
Gee, C.
Labitan, C.
Lockerby, M.
Martinez-McKinney, F.
Mazza, S. M.
Padilla, R.
Schumm, B.
Seiden, A.
Wilder, M.
Wyatt, W.
Zhao, Y.
Arcidiacono, R.
Cartiglia, N.
Ferrero, M.
Mandurrino, M.
Siviero, F.
Sola, V.
Tornago, M.
Cindro, V.
Howard, A.
Kramberger, G.
Mandić, I.
Mikuž, M.
author_sort Sadrozinski, H. F.-W.
collection CERN
description The performance of the Ultra-Fast Silicon Detectors (UFSD) after irradiation with neutrons and protons is compromised by the removal of acceptors in the thin layer below the junction responsible for the gain. This effect is tested both with capacitance – voltage, C-V, measurements of the doping concentration and with measurements of charge collection, CC, using charged particles. We find a perfect linear correlation between the bias voltage to deplete the gain layer determined with C-V and the bias voltage to collect a defined charge, measured with charge collection. An example for the usefulness of this correlation is presented.
format info:eu-repo/semantics/article
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language eng
publishDate 2020
publisher Nucl. Instrum. Methods Phys. Res., A
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spelling cern-27180582022-08-10T13:58:17Z doi:10.1016/j.nima.2020.164611 http://cds.cern.ch/record/2718058 eng Sadrozinski, H. F.-W. Jin, Y. Ren, H. Christie, S. Galloway, Z. Gee, C. Labitan, C. Lockerby, M. Martinez-McKinney, F. Mazza, S. M. Padilla, R. Schumm, B. Seiden, A. Wilder, M. Wyatt, W. Zhao, Y. Arcidiacono, R. Cartiglia, N. Ferrero, M. Mandurrino, M. Siviero, F. Sola, V. Tornago, M. Cindro, V. Howard, A. Kramberger, G. Mandić, I. Mikuž, M. Experimental Study of Acceptor Removal in UFSD Detectors and Experimental Techniques 7: Advanced hybrid pixel detectors The performance of the Ultra-Fast Silicon Detectors (UFSD) after irradiation with neutrons and protons is compromised by the removal of acceptors in the thin layer below the junction responsible for the gain. This effect is tested both with capacitance – voltage, C-V, measurements of the doping concentration and with measurements of charge collection, CC, using charged particles. We find a perfect linear correlation between the bias voltage to deplete the gain layer determined with C-V and the bias voltage to collect a defined charge, measured with charge collection. An example for the usefulness of this correlation is presented. info:eu-repo/grantAgreement/EC/FP7/654168 info:eu-repo/semantics/openAccess Education Level info:eu-repo/semantics/article http://cds.cern.ch/record/2718058 Nucl. Instrum. Methods Phys. Res., A Nucl. Instrum. Methods Phys. Res., A, (2020) pp. 164611 2020
spellingShingle Detectors and Experimental Techniques
7: Advanced hybrid pixel detectors
Sadrozinski, H. F.-W.
Jin, Y.
Ren, H.
Christie, S.
Galloway, Z.
Gee, C.
Labitan, C.
Lockerby, M.
Martinez-McKinney, F.
Mazza, S. M.
Padilla, R.
Schumm, B.
Seiden, A.
Wilder, M.
Wyatt, W.
Zhao, Y.
Arcidiacono, R.
Cartiglia, N.
Ferrero, M.
Mandurrino, M.
Siviero, F.
Sola, V.
Tornago, M.
Cindro, V.
Howard, A.
Kramberger, G.
Mandić, I.
Mikuž, M.
Experimental Study of Acceptor Removal in UFSD
title Experimental Study of Acceptor Removal in UFSD
title_full Experimental Study of Acceptor Removal in UFSD
title_fullStr Experimental Study of Acceptor Removal in UFSD
title_full_unstemmed Experimental Study of Acceptor Removal in UFSD
title_short Experimental Study of Acceptor Removal in UFSD
title_sort experimental study of acceptor removal in ufsd
topic Detectors and Experimental Techniques
7: Advanced hybrid pixel detectors
url https://dx.doi.org/10.1016/j.nima.2020.164611
http://cds.cern.ch/record/2718058
http://cds.cern.ch/record/2718058
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